Optical properties of in vacuo lithiated nanoporous WO3:Mo thin films as determined by spectroscopic ellipsometry

Electronic and Structural Properties of Molybdenum Thin Films as Determined by Real Time Spectroscopic Ellipsometry

This Article is brought to you for free and open access by the Electrical & Computer Engineering at ODU Digital Commons. It has been accepted for inclusion in Electrical & Computer Engineering Faculty Publications by an authorized administrator of ODU Digital Commons. For more information, please contact [email protected]. Repository Citation Walker, J. D.; Khatri, H.; Ranjan, V.; Li, Jian...

Optical Monitoring of Thin-films Using Spectroscopic Ellipsometry

Spectroscopic Ellipsometry (SE) offers a precise technique for measuring thin film properties. Advanced SE instrumentation has been demonstrated as an excellent technique for monitoring the growth of optical films for sputtering applications. We have recently extended this technique for PVD E-gun evaporated films. In this paper we will show how an SE system was integrated into a standard optica...

Spectroscopic ellipsometry of metal phthalocyanine thin films.

Optical functions of cobalt phthalocyanine, nickel phthalocyanine (NiPc), and iron phthalocyanine (FePc) have been determined by use of spectroscopic ellipsometry in the spectral range 1.55-4.1 eV (300-800 nm). The samples were prepared by evaporation onto glass and silicon substrates. The optical functions were determined by point-to-point fit. Absorption spectra were also measured. The index-...

Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example

Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example" (1997). We present a microstructure-dependent anisotropic infrared-optical dielectric function model for mixed-phase polycrystalline material from which we derive the transverse and longitudinal-optical modes observable in thin films. Infrared ellipsometry over the wave...

Uniaxial anisotropy of organic thin films determined by ellipsometry